Scanning Electron Microscope (SEM) as one of the major research and industrial equipment for imaging of micro-scale samples and surfaces has gained extensive attention from its emerge. However. the acquired micrographs still remain two-dimensional (2D). In the current work a novel and highly accurate approach is proposed to recover the hidden third-dimension by use of multi-view image... https://www.diegojavierfares.com/flash-offer-A-D-EJ-123-Newton-Compact-Balance-Scale-120-x-0-001-g-hot-grab/